Top 10 Links in Science http://www.bid-link.co.uk/%cat_tags%/ en-us Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling. This is the first book to be dedicated to the subject and the treatment is comprehensive. http://www.impublications.com/shop/tof-sims-surface-analysis-by-mass-spectrometry.html 1.00 Scientific Publications covering mass spectrometry, NIR & NMR Spectroscopy and surface technologies. http://www.impublications.com/journal/ejms 1.00